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JEOL 2010F Transmission Electron Microscope (TEM)

Contact: Dr. K. Jarvis
Email:
Location: FNT B134

Equipment Type:

Electron Microscopy

Transmission Electron Microscopy (TEM)

Information the Equipment Can Provide

The JEOL 2010F is a high-resolution transmission electron microscope.

Key Features

  • Lattice Imaging (HRTEM)
  • Elemental identification and mapping (EDXS and EELS)
  • Electronic state identification and mapping (EELS)
  • Magnetic and electronic field mapping (Electron Holography)
  • Phase and orientation identification/mapping with 1 – 2 nm resolution (Diffraction – STEM)
  • Automated phase and orientation mapping (Precession Electron Diffraction) – similar to EBSD but with a resolution of ~ 5 nm
  • In-situ heating and biasing

Specifications

  • Imaging Modes: TEM/STEM
  • Voltage: 120/200 KV
  • Cs: 0.5 mm
  • Point to Point Resolution: 0.19 nm
  • Focused Probe: 0.2 nm
  • Source: Schottky Field Emission
  • Tilt Range: 15°

Attached Equipment

  • Gatan OneView Camera with IS software
  • Silicon Drift EDS Detector
  • EELS Detector
  • Bi-prism
  • ASTAR Precession Electron Diffraction
  • Double-Tilt Holder
  • Protochips Heating/Biasing Holder

lattice imaging

elemental mapping

orientation mapping

diffraction stem

Fees and Policies

  • UT Users: $60/hour
  • Higher Education/State Agencies: $184/hour
  • Corporate/External Users: $184/hour

To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.