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Photo of X-ray Diffraction

Rigaku ULTIMA IV Diffractometer

Contact: Dr. Steve Swinnea
Location: EER 6.640

Equipment Type:

X-ray Diffraction

X-ray Scattering

Information the Equipment Can Provide

Identification of crystalline phases, crystallinity, crystallite size, crystal structure determination, thin film properties, non-ambient (elevated) temperature, micro-area, SAXS.

illustration for parallel focusing
illustration for parallel beam focusing

rigaku illustration

rigaku graph

Fees and Policies

  • UT Users: $8/hour
  • Higher Education/State Agencies: $17/hour
  • Corporate/External Users: $17/hour

To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.