Facilities
Facilities
Materials Analysis and Spectroscopy Facility
Located primarily on the 6th floor of the Engineering Education and Research Building (EER), the MAS facility provides state-of-the-art instrumentation for analyzing the surface composition of materials, the surface topology, and the crystallinity of materials. This includes multiple x-ray photoemission spectroscopy (XPS), time of flight secondary ion mass spectroscopy, various x-ray diffraction systems, atomic force microscopy, scanning electron microscopy, surface profilometers, and air-free sample preparation setups. On the 5th floor of EER, the materials property lab provides access absorption and fluorescence spectrometers, Raman spectroscopy, FTIR, DLS, and rheology measurements.
Keyence VK-X1100 Optical Profilometer
Equipment Type:
Microscopy/Surface Analysis
Optical Profiles
Surface Analysis
Contact: Dr. Andrei Dolocan
Location: EER 6.636
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Rigaku ULTIMA IV Diffractometer
Equipment Type:
X-ray Diffraction
X-ray Scattering
Contact: Dr. Steve Swinnea
Location: EER 6.640
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Scintag X1 Theta-Theta Diffractometer
Equipment Type:
X-ray Diffraction
Contact: Dr. Steve Swinnea
Location: EER 6.640
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Rigaku Miniflex 600 Diffractometer
Equipment Type:
X-ray Diffraction
X-ray Scattering
Contact: Dr. Steve Swinnea
Location: EER 6.640
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Rigaku Miniflex 600 Diffractometer II
Equipment Type:
X-ray Diffraction
X-ray Scattering
Contact: Dr. Steve Swinnea
Location: EER 6.640
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FEI Quanta 650 ESEM
Equipment Type:
Electron Microscopy
Scanning Electron Microscopes (SEM)
Contact: Dr. Andrei Dolocan
Location: EER 6.628
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Nano/Microfiber Electrospinning System
Equipment Type:
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: EER 6.628
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Kratos X-ray Photoelectron Spectrometer – Axis Ultra DLD
Equipment Type:
Microscopy/Surface Analysis
Contact: Dr. Hugo Celio
Location: EER 6.636
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Dynamic Light Scattering Zetasizer Nano ZS
Equipment Type:
Polymer Characterization
Contact: Dr. Hugo Celio
Location: EER 6.640
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Hitachi IM4000C Broad Beam Ion Milling System
Equipment Type:
Nano and Micro Fabrication
Contact: Dr. Hugo Celio
Location: EER 6.636
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Infrared Spectrometer-Infinity Gold FTIR
Equipment Type:
Polymer Characterization
Spectroscopy
Contact: Dr. Hugo Celio
Location: EER 6.640
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Mettler Thermogravimetric Analyzer, Model TGA/DSC 1
Equipment Type:
Polymer Characterization
Contact: Dr. Hugo Celio
Location: EER 6.636
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SV-100 Viscometer
Equipment Type:
Polymer Characterization
Contact: Dr. Hugo Celio
Location: EER 6.640
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SAXSLabs Ganesha
Equipment Type:
SAXS
X-ray Scattering
Contact: Dr. Steve Swinnea
Location: EER 6.640
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Asylum MFP-3D AFM
Equipment Type:
Atomic Force Microscopes
Microscopy/Surface Analysis
Contact: Dr. Raluca Gearba
Location: EER 6.628
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Park Systems NX10 AFM
Equipment Type:
Atomic Force Microscopes
Microscopy/Surface Analysis
Location: EER 6.628
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Cary 5000 UV/Vis NIR
Equipment Type:
Spectroscopy
Contact: Dr. Raluca Gearba
Location: EER 6.636
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Fluorolog3 Fluorimeter
Equipment Type:
Spectroscopy
Contact: Dr. Raluca Gearba
Location: EER 6.636
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OptiLab Refractometer
Equipment Type:
Polymer Characterization
Contact: Dr. Hugo Celio
Location: EER 6.640
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Witec Micro-Raman Spectrometer Alpha 300
Equipment Type:
Micro Raman Spectra
Spectroscopy
Contact: Dr. Andrei Dolocan
Location: EER 6.628
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Extrel Max XT Mass Spectrometer
Equipment Type:
Microscopy/Surface Analysis
Surface Analysis
Contact: Dr. Hugo Celio
Location: EER 6.636
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Mbraun Argon Glovebox I
Equipment Type:
Microscopy/Surface Analysis
Surface Analysis
Contact: Dr. Hugo Celio
Location: EER 6.636
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Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS 5)
Equipment Type:
Microscopy/Surface Analysis
Contact: Dr. Andrei Dolocan
Location: EER 6.636
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Hood for Handling Powder Materials
Equipment Type:
TEM Sample Preparation
Contact: Dr. Raluca Gearba
Location: EER 6.626
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Mbraun Nitrogen Glovebox
Equipment Type:
Microscopy/Surface Analysis
TEM Sample Preparation
Contact: Dr. Raluca Gearba
Location: EER 6.626
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Hood for STM and TEM Sample Prep
Equipment Type:
Microscopy/Surface Analysis
TEM Sample Preparation
Contact: Dr. Raluca Gearba
Location: EER 0.746
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Scanning Tunneling Microscopes
Equipment Type:
Microscopy/Surface Analysis
Scanning Tunneling Microscopes (STM)
Surface Analysis
Contact: Dr. Raluca Gearba
Location: EER 0.746
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Park Scientific CP and XE-100 AFMs
Equipment Type:
Atomic Force Microscopes
Microscopy/Surface Analysis
Contact: Dr. Raluca Gearba
Location: EER 6.626
