Facilities
Facilities
Instrumentation
Acids Hood
Equipment Type:
Cleanroom Instrumentation
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Acids Hood
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Aixtrom Black Magic
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Plasma Etching and Material Growth
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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AM Scope
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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AMOD Thermal Deposition System
Equipment Type:
Cleanroom Instrumentation
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Apreo 2C LoVac SEM
Equipment Type:
Electron Microscopy
Microscopy/Surface Analysis
Scanning Electron Microscopes (SEM)
Contact: Dr. Andrei Dolocan
Location: EER 0.752
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Asylum MFP-3D AFM
Equipment Type:
Atomic Force Microscopes
Metrology
Microscopy/Surface Analysis
Contact: Dr. Raluca Gearba
Location: EER 6.628
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Atomic Force Microscopes
Equipment Type:
Atomic Force Microscopes
Microscopy/Surface Analysis
Contact: Dr. Raluca Gearba
Location: EER 6.626
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Bruker Invernio R FTIR
Equipment Type:
Polymer Characterization
Spectroscopy
Contact: Dr. Hugo Celio
Location: EER 6.640
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Cambridge Nanotech Savannah TM200 ALD
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Cary 5000 UV/Vis NIR
Equipment Type:
Spectroscopy
Contact: Dr. Raluca Gearba
Location: EER 6.644
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Cleanroom Instrumentation
Equipment Type:
Cleanroom Instrumentation
Metrology
Nano and Micro Fabrication
Plasma Etching and Material Growth
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Contact Angle Goniometer
Equipment Type:
Cleanroom Instrumentation
Metrology
Surface Analysis
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Cooke e-beam and Sputtering System
Equipment Type:
Cleanroom Instrumentation
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Dektak 6M Stylus Profilometer
Equipment Type:
Cleanroom Instrumentation
Metrology
Microscopy/Surface Analysis
Surface Analysis
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Denton Thermal Evaporator
Equipment Type:
Cleanroom Instrumentation
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Disco 321 Wafer Dicing Saw
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Dynamic Light Scattering Zetasizer Nano ZS
Equipment Type:
Polymer Characterization
Contact: Dr. Hugo Celio
Location: 6.640
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Electrical Characterization Instrumentation
Equipment Type:
Cleanroom Instrumentation
Electrical Characterization Instrumentation
Electronic and Optoelectronic Testing
Contact: Dr. Raluca Gearba
Location: FNT 4.102
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EMS Sputter Coater
Equipment Type:
Thin Film Fabrication
Contact: Dr. Andrei Dolocan
Location: EER 0.752
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FEI Quanta 650 ESEM
Equipment Type:
Electron Microscopy
Microscopy/Surface Analysis
Scanning Electron Microscopes (SEM)
Contact: Dr. Andrei Dolocan
Location: EER 6.628
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Fluorolog3 Fluorimeter
Equipment Type:
Spectroscopy
Contact: Dr. Raluca Gearba
Location: EER 6.644
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Fuljifilm DMP-2800 Dimatix Printer
Equipment Type:
Cleanroom Instrumentation
Lithography
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Gatan 691 Precision Ion-Miller
Equipment Type:
TEM Sample Preparation
Contact: Dr. Xun Zhan
Location: EER 0.922
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HF Hood
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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HF Hood
Equipment Type:
Cleanroom Instrumentation
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Hitachi IM4000C Broad Beam Ion Milling System
Equipment Type:
Nano and Micro Fabrication
Contact: Dr. Hugo Celio
Location: EER 6.636
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Hitachi Ozone Cleaner
Equipment Type:
TEM Sample Preparation
Contact: Dr. Xun Zhan
Location: EER 0.752
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Hitachi S-5500 SEM/STEM
Equipment Type:
Electron Microscopy
Scanning Electron Microscopes (SEM)
Contact: Dr. Andrei Dolocan
Location: EER 0.752
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HMDS YES OVEN
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Hood for Handling Powder Materials
Equipment Type:
Scanning Electron Microscopes (SEM)
TEM Sample Preparation
Contact: Dr. Raluca Gearba
Location: EER 6.628
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Hood for STM and TEM Sample Prep
Equipment Type:
Microscopy/Surface Analysis
TEM Sample Preparation
Contact: Dr. Raluca Gearba
Location: EER 0.746
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J.A. Wollam M2000 Spectroscopic Ellipsometer
Equipment Type:
Cleanroom Instrumentation
Metrology
Spectroscopy
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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JEOL NEOARM Low kV STEM Corrected
Equipment Type:
Electron Microscopy
Transmission Electron Microscopy (TEM)
Contact: Dr. Xun Zhan
Location: EER 0.762
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Keyence VK-X1100 Optical Profilometer
Equipment Type:
Microscopy/Surface Analysis
Optical Profiles
Surface Analysis
Contact: Dr. Andrei Dolocan
Location: EER 6.636
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KLA P-7 Stylus Profilometer
Equipment Type:
Cleanroom Instrumentation
Metrology
Microscopy/Surface Analysis
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Kratos X-ray Photoelectron Spectrometer – Axis Ultra DLD
Equipment Type:
Microscopy/Surface Analysis
Surface Analysis
Contact: Dr. Hugo Celio
Location: EER 6.636
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KSV Langmuir-Blodgett Trough
Equipment Type:
Cleanroom Instrumentation
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Kurt J Lesker Nano36 Thermal Deposition System
Equipment Type:
Cleanroom Instrumentation
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Laurell Technologies Spincoater I
Equipment Type:
Cleanroom Instrumentation
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Laurell Technologies Spincoater II
Equipment Type:
Cleanroom Instrumentation
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: EER 6.626
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Laurell Technologies Spincoater III
Equipment Type:
Microscopy/Surface Analysis
Spectroscopy
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: EER 6.628
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March Plasma CS170IF RIE Etching System
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Plasma Etching and Material Growth
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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MBraun Nitrogen Glovebox
Equipment Type:
Microscopy/Surface Analysis
Contact: Dr. Raluca Gearba
Location: EER 6.628
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Mettler Thermogravimetric Analyzer, Model TGA/DSC 1
Equipment Type:
Polymer Characterization
Contact: Dr. Hugo Celio
Location: EER 6.636
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Nano/Microfiber Electrospinning System
Equipment Type:
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: EER 6.644
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Nordson March PX-250 RIE
Equipment Type:
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Omicron LT-STM/SPM
Equipment Type:
Microscopy/Surface Analysis
Scanning Tunneling Microscopes (STM)
Surface Analysis
Contact: Dr. Raluca Gearba
Location: EER 0.746
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Oxford Instruments Plasma Lab 80+ PECVD and Etching
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Plasma Etching and Material Growth
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Park Systems NX10 AFM
Equipment Type:
Atomic Force Microscopes
Microscopy/Surface Analysis
Location: EER 6.628
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Plasma Therm 790 RIE/ICP/PECVD
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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PVD75 e-beam and Sputtering System
Equipment Type:
Cleanroom Instrumentation
Thin Film Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Quorum Technologies Critical Point Drier
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Rigaku Miniflex 600 Diffractometer I
Equipment Type:
X-ray Diffraction
X-ray Scattering
Contact: Dr. Steve Swinnea
Location: EER 6.640
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Rigaku Miniflex 600 Diffractometer II
Equipment Type:
X-ray Diffraction
X-ray Scattering
Contact: Dr. Steve Swinnea
Location: EER 6.640
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Rigaku ULTIMA IV Diffractometer
Equipment Type:
X-ray Diffraction
X-ray Scattering
Contact: Dr. Steve Swinnea
Location: EER 6.640
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Samco RIE-1C Reactive Ion Etcher
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Plasma Etching and Material Growth
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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SAXSLabs Ganesha
Equipment Type:
SAXS
X-ray Scattering
Contact: Dr. Steve Swinnea
Location: EER 6.640
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Scintag X1 Theta-Theta Diffractometer
Equipment Type:
X-ray Diffraction
Contact: Dr. Steve Swinnea
Location: EER 6.640
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Scios 2HiVac Dual beam FIB/SEM System with EBL Capabilities
Equipment Type:
Electron Microscopy
Nano and Micro Fabrication
TEM Sample Preparation
Contact: Dr. Raluca Gearba
Location: EER 0.756
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Solar Cells Testing Glovebox
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Suss MA6 Mask Aligner
Equipment Type:
Cleanroom Instrumentation
Lithography
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Suss MA6 Mask Aligner (system 2)
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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SV-10 Viscometer
Equipment Type:
Polymer Characterization
Contact: Dr. Hugo Celio
Location: EER 6.640
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Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS 5)
Equipment Type:
Microscopy/Surface Analysis
Surface Analysis
Contact: Dr. Andrei Dolocan
Location: EER 6.636
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Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS M6)
Equipment Type:
Microscopy/Surface Analysis
Surface Analysis
Contact: Dr. Andrei Dolocan
Location: EER 6.636
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Vacuum Ovens
Equipment Type:
Cleanroom Instrumentation
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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VersaProbe4 X-ray Photoelectron Spectrometer
Equipment Type:
Microscopy/Surface Analysis
Surface Analysis
Contact: Dr. Hugo Celio
Location: EER 6.636
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West Bond Wire Bonder
Equipment Type:
Cleanroom Instrumentation
Electronic and Optoelectronic Testing
Nano and Micro Fabrication
Contact: Dr. Raluca Gearba
Location: FNT 4.106
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Witec Micro-Raman Spectrometer Alpha 300
Equipment Type:
Micro Raman Spectra
Spectroscopy
Contact: Dr. Andrei Dolocan
Location: EER 6.644
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Wyko NT 9100 Optical Profilometer
Equipment Type:
Microscopy/Surface Analysis
Optical Profiles
Surface Analysis
Contact: Dr. Andrei Dolocan
Location: EER 6.628
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Zeiss Axioscope 2 MAT Optical Microscope
Equipment Type:
Cleanroom Instrumentation
Metrology
Microscopy/Surface Analysis
Contact: Dr. Raluca Gearba
Location: FNT 4.106