Equipment by Research Use: Surface Composition

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Equipment Types
Research Uses
Name Category Contact
Scios 2 HiVac FIB/SEM system with EBL capabilities Gearba, Raluca
JEOL NEOARM – Low kV STEM Corrected Jarvis, K.
SEM: Quanta FEG 600 Piner, Richard
Atomic Force Microscopes: Park Scientific Piner, Richard
Spectroscopy: Witec Micro-Raman Spectrometer Alpha 300 Piner, Richard
Kratos X-ray Photoelectron Spectrometer – Axis Ultra DLD Celio, Hugo
Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS 5) Dolocan, Andrei
JEOL 2010F Transmission Electron Microscope (TEM) Jarvis, K.
Name Category Contact