Information the equipment can provide
Multi-technique Spectrometer with photoelectron and ion Spectroscopies, including surface-mapping capability
This multi-technique with photoelectron and ion spectroscopies, including surface-mapping capabilties, was purchased from Kratos Analytical in 2007 to determine surface elemental and composition analysis. Most samples can be analyzed in a non-invasize or non-distructive method. This instrument is equipped with additional techniques:
- X-ray photoelectron spectroscopy (XPS) provides information on elemental composition and chemical bonding states of materials
- Ultraviolet photoelectron spectroscopy (UPS) provides information on valence levels and work function measurements of materials
- Low energy Ion Scattering spectroscopy (ISS) provides provide evaluation of the elemental composition and structure of solid surfaces
- XPS mode is also capable of surface mapping to provide lateral distribution maps of elemental and chemical species at the surface.
- Signal detected: Photoelectron from near surface atoms
- Elements detected: From Lithium to heavy metals
- Detection limits: 0.1 to 1 atomic %.
- Depth resolution: 2 to 8 nm
- Depth Profile: 0.5 nm/second using Argon ions
- Lateral resolution: 15 to 500 microns
The Kratos XPS is also equipped with a set of chambers and a capsule (collectively called ROX interface) to transfer air sensitive samples from an argon (or nitrogen) filled glove box to the XPS surface analysis chamber which is under ultra-high vacuum (UHV). The ROx Interface was designed and developed at the Texas Materials Institute (U.S. Patent Application Serial No. 14/445,650 filed July 29, 2014). Unlike commercial interfaces, the Rox interface was designed with a unique innovation: It has a built-in semi-quantitative method to monitor sample transfer reliability and validity.
Fees & Policies
- Trained On-Campus UT Users: $48.00/hr
- Higher Education/State Agencies: $118.00/hr
- Corporate Users: $250/hr