SEM: Hitachi S5500 SEM/STEM

Reserve Equipment

Information the equipment can provide

hitachiHitachi S-5500 SEM provides sub-nanometer resolution and is also capable of imaging in scanning transmission electron microscopy (STEM) mode. The bright field (BF) and dark field (DF) Duo-STEM detector allows simultaneous observation of BF and DF STEM images. The equipped energy dispersive spectroscopy (EDS) can probe the chemical composition of materials at nanometer scale.



Fees & Policies
  • Trained On-Campus UT Users: $40/h
  • Higher Ed/State Agencies: $111/h
  • Corporate Users: $111/h

Learning sessions: 3 sessions, each session is 2 hrs. 1st session: basic operations and functions of the SEM using TMI reference materials. 2nd session: imaging using user’s samples. 3rd session: SEM imaging combined with EDS and/or backscattered electron detector.


EER 0.752