Information the equipment can provide
Hitachi S-5500 SEM provides sub-nanometer resolution and is also capable of imaging in scanning transmission electron microscopy (STEM) mode. The bright field (BF) and dark field (DF) Duo-STEM detector allows simultaneous observation of BF and DF STEM images. The equipped energy dispersive spectroscopy (EDS) can probe the chemical composition of materials at nanometer scale.
Fees & Policies
- Trained On-Campus UT Users: $40/h
- Higher Ed/State Agencies: $111/h
- Corporate Users: $111/h
Learning sessions: 3 sessions, each session is 2 hrs. 1st session: basic operations and functions of the SEM using TMI reference materials. 2nd session: imaging using user’s samples. 3rd session: SEM imaging combined with EDS and/or backscattered electron detector.