Atomic Force Microscope: Agilent 5500

Reserve Equipment

Information the equipment can provide

The Agilent 5500 scanning probe microscope (SPM) is equipped with a variety of imaging
modes to measure surface characteristics of samples up to 20x20mm in size. The system is
equipped with a fluid cell for imaging in liquids and a chamber for measurements in a nitrogen
environment. Available scanning techniques: contact mode, acoustic tapping mode, magnetic
tapping mode, phase imaging, lateral force microscopy, magnetic force microscopy, electrostatic
force microscopy, and Kelvin probe microscopy.  Users are provided tips (MikroMasch HQ:NSC15/Cr-Au BS) already mounted on the scanner head.


  • 90 μm by 90 μm scan area
  • Z range of 7 μm
  • Vertical noise of ~0.5 Å RMS
Fees & Policies
  • Trained On-Campus UT Users: $30/h
  • Higher Ed/State Agencies: $51/h
  • Corporate Users: $65/h

Facility User Education

To become a user of this instrument please sign up for the next available NT221 facility user education class.  External/Corporate users must contact CNM to setup an account before attending facility user education classes.

Fee: $77.00


FNT 4.102


Raluca Gearba