Filter Equipment by:
Equipment Types
Research Uses
Name Category Contact
AMOD Sputtering Gearba, Raluca
Acids Hoods Gearba, Raluca
Omicron Nanotechnology Low-Temperature Scanning Probe Microscopy (LT-SPM) System Gearba, Raluca
EasyTube 3000EXT Chemical Vapor Deposition (CVD) System Gearba, Raluca
MPT RTP-600S Rapid Thermal Annealer Gearba, Raluca
Electron Beam Lithography Tool – NEEDS EXTENSIVE REPAIRS Gearba, Raluca
SCS Spincoater/MBraun Glovebox System Gearba, Raluca
AMOD PVD System Gearba, Raluca
KSV Langmuir-Blodgett Assembly and Deposition Trough Gearba, Raluca
FUJIFILM DMP-2800 Dimatix Materials Printer Gearba, Raluca
Denton Thermal Deposition II (Analog Interface) Gearba, Raluca
Specialty Coating Systems Spincoater Gearba, Raluca
Denton Thermal Deposition I (Digital Interface) Gearba, Raluca
Cooke Ebeam/Sputter Deposition System Gearba, Raluca
Laurell Technologies Spincoater Gearba, Raluca
Cleanroom Ovens Gearba, Raluca
West Bond Wire Bonder Gearba, Raluca
Nano/Microfiber Electrospinning System Gearba, Raluca
Quorum Technologies Critical Point Drier Gearba, Raluca
March Plasma CS170IF RIE Etching System Gearba, Raluca
Disco 321 Wafer Dicing Saw Gearba, Raluca
Suss MA6 Mask Aligner Gearba, Raluca
Oxford Instruments Plasma Lab 80+ PECVD and Etching Gearba, Raluca
FEI Strata DB235 SEM/FIB with Zyvex S100 Gearba, Raluca
Fluorolog3 Fluorimeter Gearba, Raluca
Cary 5000UV-VIS NIR Gearba, Raluca
J.A. Wollam M2000 Spectroscopic Ellipsometer Gearba, Raluca
Agilent 4156C Semiconductor Parameter Analyzer II Gearba, Raluca
Solar Cell Testing Glovebox Gearba, Raluca
Agilent 4156C Semiconductor Parameter Analyzer I Gearba, Raluca
Keithly 4200SCS Semiconductor Characterization System Gearba, Raluca
Suss PM 5 Probe Station Gearba, Raluca
Asylum Research MFP-3D Atomic Force Microscope Gearba, Raluca
RHK ATM 300 Scanning Tunneling Microscope Gearba, Raluca
Zeiss Axioscope 2 MAT Optical Microscope Gearba, Raluca
Zygo Interferometer Gearba, Raluca
Contact Angle Goniometer Gearba, Raluca
Agilent 5500 Atomic Force Microscope Gearba, Raluca
Hirox 3d Video Microscope Gearba, Raluca
Dektak 6M Stylus Profilometer Gearba, Raluca
Rigaku MiniFlex 600 II Swinnea, Steve
SEM Quanta FEG 600 Piner, Richard
Wyko NT 9100 Optical Profilometer Piner, Richard
Park Scientific AFMs Piner, Richard
Witec Micro-Raman Spectrometer Alpha 300 Piner, Richard
Rigaku Ultima IV Swinnea, Steve
Rigaku MiniFlex 600 I Swinnea, Steve
Rigaku Laue/Precession Swinnea, Steve
Philips XPERT Theta-Theta Diffractometer Swinnea, Steve
Small Angle X-Ray Scattering (SAXS) Swinnea, Steve
Kratos X-ray Photoelectron Spectrometer – Axis Ultra DLD Celio, Hugo
FEI Quanta 650 ESEM Dolocan, Andrei
Infrared Spectrometer – Infinity Gold FTIR Celio, Hugo
Dynamic Light Scattering Zetasizer Nano ZS Celio, Hugo
Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS 5) Dolocan, Andrei
Hitachi S5500 SEM/STEM Dolocan, Andrei
Scintag X1 Theta-Theta Diffractometer Swinnea, Steve
Mettler Thermogravimetric Analyzer, Model TGA/DSC 1 Celio, Hugo
JEOL 2010F Transmission Electron Microscope (TEM) Jarvis, K.
Name Category Contact