Atomic Force Microscopy (AFM) Workshop

Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), in conjunction with the Center for Nano- and Molecular Science and Technology (CNM) at The University of Texas at Austin, will be hosting an Atomic Force Microscopy (AFM) Workshop on September 14-15, 2011. The workshop will include lectures and equipment/imaging demonstrations/tutorials for both life science applications and electrical characterization of materials. Topics include force measurements and mapping, Scanning Kelvin Probe Microscopy (SKPM), nanomechanics in biology, piezoresponse force microscopy (PFM), thermal analysis and high resolution imaging with Cypher™, the world’s fastest and highest resolution AFM. Please see the WORKSHOP SCHEDULE.

 All faculty and students are encouraged to attend this workshop. The workshop is open to current AFM researchers looking to learn more about AFM techniques, as well as those new to AFM that want to learn how AFM can be used in their own research.


Please see the website or contact us if you have any questions regarding the conference:

Asylum Research
Terry Mehr

The University of Texas at Austin
Keith Stevenson
Department of Chemistry & Biochemistry