The Unversity of Texas at Austin

MS & PhD Program

Thrust Areas

Nanostrutural Characterization Facility

Facility Overview
This facility is used to investigate topographic, electronic, chemical, and optical properties of vast range of materials and devices, including semiconductors, metals and chemical catalysts, with resolution down to the atomic level, and in ultra high vacuum environment. State-of-the-art imaging capabilities are available for advanced materials research and education. Because of the complexity of the equipment, only trained personnel can use it.

Contact Information
C.K. Shih ,
R. Martinez, and
A. de Lozanne

Services
Scanning electron microscope(SEM)
Scanning tunneling microscope/spectroscopy(STM/STS)
Scanning Auger microscope/spectroscopy (SAM/SAS)
STM tip induced luminescence spectroscopy
Cathode luminescence spectroscopy

Fee Schedule
Use contact information above.