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Photo of Atomic Force Microscopes

Park Scientific CP and XE-100 AFMs

Contact: Dr. Raluca Gearba
Email:
Location: EER 6.626

Equipment Type:

Atomic Force Microscopes

Microscopy/Surface Analysis

Information the Equipment Can Provide

TMI maintains two older Atomic Force Microscopes from Park Scientific Instruments. These AFMs are aimed at high resolution surface topography. Only experienced AFM users will be allowed to use these AFMs.

Park Scientific Instruments Autoprobe CP-Research

  • The AutoProbe CP-­‐R instruments consists of a CP-R probe head, a manual XY stage , a motorized Z stage and a 5 microns scanner.
  • Configurated with a high resolution 5 micrometers piezo scanner with a maximum vertical range of 2.5 microns.
  • The system is set to operate in contact and LFM mode
  • Sensor are premounted: Coated Sharpened Microlevers MSCT-MT-A (former MSCT-AUNM)

Park Scientific Instruments XE-100

  • Configured with a 50 microns scanner specialized for high-resolution non-contact AFM.
  • Pre-mounted AFM sensors: PPP-NCHR

Fees and Policies

  • UT Users: $10/hour
  • Higher Education/State Agencies: $77/hour
  • Corporate/External Users: $100/hour

To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.

To become a user of this instrument please contact the facility manager to schedule a training session. Only experienced AFM users will be allowed to use these AFMs.