Instrumentation


Photo of Nano and Micro Fabrication

Acids Hood

Equipment Type:

Nano and Micro Fabrication

Contact:
Location: FNT 4.106

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AMOD Sputtering

Equipment Type:

Cleanroom Instrumentation

Thin Film Fabrication

Contact:
Location: FNT 4.106

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AMOD Thermal Deposition System

Equipment Type:

Cleanroom Instrumentation

Thin Film Fabrication

Contact:
Location: FNT 4.106

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Photo of Atomic Force Microscopes

Asylum MFP-3D AFM

Equipment Type:

Atomic Force Microscopes

Microscopy/Surface Analysis

Contact:
Location: EER 6.628

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Photo of Atomic Force Microscopes

Atomic Force Microscopes

Equipment Type:

Atomic Force Microscopes

Microscopy/Surface Analysis

Contact:
Location: EER 6.626

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Photo of Spectroscopy

Cary 5000 UV/Vis NIR

Equipment Type:

Spectroscopy

Contact:
Location: EER 6.636

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Cleanroom Instrumentation

Equipment Type:

Cleanroom Instrumentation

Contact:
Location: FNT 4.106

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Contact Angle Goniometer

Equipment Type:

Cleanroom Instrumentation

Metrology

Surface Analysis

Contact:
Location: FNT 4.106

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Cooke e-beam and Sputtering System

Equipment Type:

Cleanroom Instrumentation

Thin Film Fabrication

Contact:
Location: FNT 4.106

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Dektak 6M Stylus Profilometer

Equipment Type:

Cleanroom Instrumentation

Metrology

Microscopy/Surface Analysis

Contact:
Location: FNT 4.106

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Photo of Cleanroom Instrumentation

Denton Thermal Evaporator

Equipment Type:

Cleanroom Instrumentation

Thin Film Fabrication

Contact:
Location: FNT 4.106

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Disco 321 Wafer Dicing Saw

Equipment Type:

Cleanroom Instrumentation

Nano and Micro Fabrication

Contact:
Location: FNT 4.106

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Photo of Polymer Characterization

Dynamic Light Scattering Zetasizer Nano ZS

Equipment Type:

Polymer Characterization

Contact:
Location: EER 6.640

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Photo of Cleanroom Instrumentation

EasyTube 3000 EXT Chemical Vapor Deposition (CVD) System

Equipment Type:

Cleanroom Instrumentation

Nano and Micro Fabrication

Plasma Etching and Material Growth

Contact:
Location: FNT 4.106

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Photo of Cleanroom Instrumentation

Electrical Characterization Instrumentation

Equipment Type:

Cleanroom Instrumentation

Electrical Characterization Instrumentation

Electronic and Optoelectronic Testing

Contact:
Location: FNT 4.102

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Photo of Thin Film Fabrication

EMS Sputter Coater

Equipment Type:

Thin Film Fabrication

Contact:
Location: EER 0.752

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Extrel Max XT Mass Spectrometer

Equipment Type:

Microscopy/Surface Analysis

Surface Analysis

Contact:
Location: EER 6.636

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Photo of Electron Microscopy

FEI Quanta 650 ESEM

Equipment Type:

Electron Microscopy

Scanning Electron Microscopes (SEM)

Contact:
Location: EER 0.752

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Photo of Spectroscopy

Fluorolog3 Fluorimeter

Equipment Type:

Spectroscopy

Contact:
Location: EER 6.636

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Photo of Cleanroom Instrumentation

Fuljifilm DMP-2800 Dimatix Printer

Equipment Type:

Cleanroom Instrumentation

Lithography

Thin Film Fabrication

Contact:
Location: FNT 4.106

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Photo of TEM Sample Preparation

Gatan 691 Precision Ion-Miller

Equipment Type:

TEM Sample Preparation

Contact:
Location: EER 6.628

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Photo of Nano and Micro Fabrication

HF Hood

Equipment Type:

Nano and Micro Fabrication

Contact:
Location: FNT 4.106

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Photo of Nano and Micro Fabrication

Hitachi IM4000C Broad Beam Ion Milling System

Equipment Type:

Nano and Micro Fabrication

Contact:
Location: EER 6.636

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Photo of TEM Sample Preparation

Hitachi Ozone Cleaner

Equipment Type:

TEM Sample Preparation

Contact:
Location: EER 0.752

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Photo of Electron Microscopy

Hitachi S-5500 SEM/STEM

Equipment Type:

Electron Microscopy

Scanning Electron Microscopes (SEM)

Contact:
Location: EER 0.752

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Photo of TEM Sample Preparation

Hood for Handling Powder Materials

Equipment Type:

TEM Sample Preparation

Contact:
Location: EER 6.626

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Photo of Microscopy/Surface Analysis

Hood for STM and TEM Sample Prep

Equipment Type:

Microscopy/Surface Analysis

TEM Sample Preparation

Contact:
Location: EER 0.746

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Photo of Polymer Characterization

Infrared Spectrometer-Infinity Gold FTIR

Equipment Type:

Polymer Characterization

Spectroscopy

Contact:
Location: EER 6.640

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Photo of Cleanroom Instrumentation

J.A. Wollam M2000 Spectroscopic Ellipsometer

Equipment Type:

Cleanroom Instrumentation

Metrology

Spectroscopy

Contact:
Location: FNT 4.106

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Photo of Electron Microscopy

JEOL 2010F Transmission Electron Microscope (TEM)

Equipment Type:

Electron Microscopy

Transmission Electron Microscopy (TEM)

Contact:
Location: FNT B134

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Photo of Electron Microscopy

JEOL NEOARM Low kV STEM Corrected

Equipment Type:

Electron Microscopy

Transmission Electron Microscopy (TEM)

Contact:
Location: EER 0.762

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Photo of Microscopy/Surface Analysis

Keyence VK-X1100 Optical Profilometer

Equipment Type:

Microscopy/Surface Analysis

Optical Profiles

Surface Analysis

Contact:
Location: EER 6.636

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Photo of Microscopy/Surface Analysis

Kratos X-ray Photoelectron Spectrometer – Axis Ultra DLD

Equipment Type:

Microscopy/Surface Analysis

Contact:
Location: EER 6.636

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Photo of Cleanroom Instrumentation

KSV Langmuir-Blodgett Trough

Equipment Type:

Cleanroom Instrumentation

Thin Film Fabrication

Contact:
Location: FNT 4.106

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Photo of Cleanroom Instrumentation

Kurt J Lesker Nano36 Thermal Deposition System

Equipment Type:

Cleanroom Instrumentation

Thin Film Fabrication

Contact:
Location: FNT 4.106

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Photo of Cleanroom Instrumentation

Laurell Technologies Spincoater I

Equipment Type:

Cleanroom Instrumentation

Thin Film Fabrication

Contact:
Location: FNT 4.106

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Photo of Cleanroom Instrumentation

Laurell Technologies Spincoater II

Equipment Type:

Cleanroom Instrumentation

Thin Film Fabrication

Contact:
Location: EER 6.626

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Photo of Cleanroom Instrumentation

March Plasma CS170IF RIE Etching System

Equipment Type:

Cleanroom Instrumentation

Nano and Micro Fabrication

Plasma Etching and Material Growth

Contact:
Location: FNT 4.106

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Mbraun Argon Glovebox I

Equipment Type:

Microscopy/Surface Analysis

Surface Analysis

Contact:
Location: EER 6.636

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Photo of Microscopy/Surface Analysis

Mbraun Nitrogen Glovebox

Equipment Type:

Microscopy/Surface Analysis

TEM Sample Preparation

Contact:
Location: EER 6.626

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Photo of Polymer Characterization

Mettler Thermogravimetric Analyzer, Model TGA/DSC 1

Equipment Type:

Polymer Characterization

Contact:
Location: EER 6.636

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Photo of Nano and Micro Fabrication

Nano/Microfiber Electrospinning System

Equipment Type:

Nano and Micro Fabrication

Contact:
Location: EER 6.628

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Photo of Polymer Characterization

OptiLab Refractometer

Equipment Type:

Polymer Characterization

Contact:
Location: EER 6.640

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Photo of Cleanroom Instrumentation

Oxford Instruments Plasma Lab 80+ PECVD and Etching

Equipment Type:

Cleanroom Instrumentation

Nano and Micro Fabrication

Plasma Etching and Material Growth

Contact:
Location: FNT 4.106

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Photo of Atomic Force Microscopes

Park Scientific CP and XE-100 AFMs

Equipment Type:

Atomic Force Microscopes

Microscopy/Surface Analysis

Contact:
Location: EER 6.626

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Photo of Atomic Force Microscopes

Park Systems NX10 AFM

Equipment Type:

Atomic Force Microscopes

Microscopy/Surface Analysis

Location: EER 6.628

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Photo of Cleanroom Instrumentation

PVD75 e-beam and Sputtering System

Equipment Type:

Cleanroom Instrumentation

Thin Film Fabrication

Contact:
Location: FNT 4.106

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Photo of Cleanroom Instrumentation

Quorum Technologies Critical Point Drier

Equipment Type:

Cleanroom Instrumentation

Nano and Micro Fabrication

Contact:
Location: FNT 4.106

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Photo of X-ray Diffraction

Rigaku Miniflex 600 Diffractometer

Equipment Type:

X-ray Diffraction

X-ray Scattering

Contact:
Location: EER 6.640

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Photo of X-ray Diffraction

Rigaku Miniflex 600 Diffractometer II

Equipment Type:

X-ray Diffraction

X-ray Scattering

Contact:
Location: EER 6.640

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Photo of X-ray Diffraction

Rigaku ULTIMA IV Diffractometer

Equipment Type:

X-ray Diffraction

X-ray Scattering

Contact:
Location: EER 6.640

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Photo of Cleanroom Instrumentation

Samco RIE-1C Reactive Ion Etcher

Equipment Type:

Cleanroom Instrumentation

Nano and Micro Fabrication

Plasma Etching and Material Growth

Contact:
Location: FNT 4.106

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Photo of SAXS

SAXSLabs Ganesha

Equipment Type:

SAXS

X-ray Scattering

Contact:
Location: EER 6.640

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Photo of Microscopy/Surface Analysis

Scanning Tunneling Microscopes

Equipment Type:

Microscopy/Surface Analysis

Scanning Tunneling Microscopes (STM)

Surface Analysis

Contact:
Location: EER 0.746

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Photo of X-ray Diffraction

Scintag X1 Theta-Theta Diffractometer

Equipment Type:

X-ray Diffraction

Contact:
Location: EER 6.640

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Photo of Electron Microscopy

Scios 2HiVac Dual beam FIB/SEM System with EBL Capabilities

Equipment Type:

Electron Microscopy

Nano and Micro Fabrication

TEM Sample Preparation

Contact:
Location: EER 0.756

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SCS 6700 Spincoater

Equipment Type:

Cleanroom Instrumentation

Thin Film Fabrication

Contact:
Location: FNT 4.106

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Photo of Cleanroom Instrumentation

Suss MA6 Mask Aligner

Equipment Type:

Cleanroom Instrumentation

Lithography

Nano and Micro Fabrication

Contact:
Location: FNT 4.106

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Photo of Polymer Characterization

SV-100 Viscometer

Equipment Type:

Polymer Characterization

Contact:
Location: EER 6.640

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Photo of Microscopy/Surface Analysis

Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS 5)

Equipment Type:

Microscopy/Surface Analysis

Contact:
Location: EER 6.636

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Photo of Cleanroom Instrumentation

Vacuum Ovens

Equipment Type:

Cleanroom Instrumentation

Nano and Micro Fabrication

Contact:
Location: FNT 4.106

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Photo of Cleanroom Instrumentation

West Bond Wire Bonder

Equipment Type:

Cleanroom Instrumentation

Nano and Micro Fabrication

Contact:
Location: FNT 4.106

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Photo of Micro Raman Spectra

Witec Micro-Raman Spectrometer Alpha 300

Equipment Type:

Micro Raman Spectra

Spectroscopy

Contact:
Location: EER 6.628

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Photo of Cleanroom Instrumentation

Work Bench for Corporate Users

Equipment Type:

Cleanroom Instrumentation

Nano and Micro Fabrication

Contact:
Location: FNT 4.106

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Photo of Microscopy/Surface Analysis

Wyko NT 9100 Optical Profilometer

Equipment Type:

Microscopy/Surface Analysis

Optical Profiles

Surface Analysis

Contact:
Location: EER 6.628

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Photo of Cleanroom Instrumentation

Zeiss Axioscope 2 MAT Optical Microscope

Equipment Type:

Cleanroom Instrumentation

Metrology

Microscopy/Surface Analysis

Contact:
Location: FNT 4.106

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Photo of Cleanroom Instrumentation

Zygo Interferometer

Equipment Type:

Cleanroom Instrumentation

Metrology

Microscopy/Surface Analysis

Contact:
Location: FNT 4.106

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