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Texas Materials Institute

An Interdisciplinary materials science and engineering research program

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• Interdisciplinary Materials Science and Engineering Graduate Program

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Home : Facilities : Core Central Facilities : Electron Microscopy Facilities

Facility Overview

Examination of solid samples using transmission and scanning electron microscopy. Observations may include morphology, crystal structure, and quantitative elemental analysis. Users must be trained (by the appropriate Facility Manager) prior to using the equipment and must abide by the rules established by the governing Advisory Committee

Advisory Committee

P. Ferreira (Chair), S. Banerjee, P. Ho, B. Korgel, D. Kovar, D. Paul

 

High Performance Transmission Electron MIcroscopy

UT-Austin Main Campus

 

 

Contact Information

Dr. Ji-Ping Zhou, Facility Manager Texas Materials Institute ENS 31N Mail Code C2201 Phone (512) 232-1884 FAX (512) 475-8482 jpzhou@mail.utexas.edu

US Mailing Address: The University of Texas at Austin Texas Materials Institute 1 University Station C2201 Austin, TX 78712

Instruments	JEOL 2010F Transmission Electron Microscope (TEM) Field Emission Gun (FEG) Ultra high-Resolution Observation System Fast Operating for network (NT) and Imaging System Scanning Image Devices to be operated as STEM from TEM Electron Biprism for holography Several atom level probes connected to Oxford INCA Energy Dispersive Spectrometer (EDS) and Gatan 2D Digital-Parallel Electron Energy Loss Spectrometer (DigiPEELS) Location: (ENS 31N) On-line Reservations
Specimen Preparation Facilities	Fishione1010 Ion Miller Fishione150 Dimpling Grinder Fishione150 Plasma Cleaner Fishione 150 Ultrasonic Disk Cutter
Services	Training of new users in instrument operation. Consultation on new uses by experienced users.
Fee Schedule	JEOL 2010F: $50/hour * Sample Preparation: $50/sample *This rate applies when the researcher (A Users) operates the microscope under minimal supervision of the Facilities Manager. For researchers (B USERS) who do not wish to be trained in the use of the micrscope, the Facilities Manager will operate the microscope for them; the rate for this level of service is $110/hour. These are on campus user rates. Off campus users should contact Facility Manager for current rates.

 

Scanning Electron Microscopy

Facility Overview
The scanning electron microscopy facility has two electron microscopes, the LEO 1530 SEM and the Hitachi S-5500 SEM, which is equipped with scanning transmission electron microscope (STEM). These electron microscopes provide excellent image resolution, including elemental composition analysis using energy dispersive X-rays (EDX).

Principal capabilities:

LEO 1530 SEM

• Large sample analysis (maximum 6 inches in diameter)
• Multiple sample loading capability
• 5 nm resolution at 20 KV
• EDX for elemental composition and mapping
• Click here for On-line reservations for the LEO 1530 SEM
  

Hitachi S-5500 SEM equipped with STEM

• Small sample analysis
  
  a.  For SEM, bulk sample size (maximum) is 5 mm x 9.5 mm x 3.5 mm.  Samples holders should
       be purchased at http://www.tedpella.com/SEM16243.htm
  b.  For STEM, samples should be deposited on commercial TEM grid

• 0.4 nm resolution at 30 KV

• EDX for elemental composition and mapping

• Click here for On-line reservations for the Hitachi S-5500 SEM/STEM

Facility Manager

Dr. Hugo Celio Surface Analysis Facility Manager Materials Texas Institute University of Texas at Austin 2.110 NST 1 University Station A5500 Austin, TX 78712

hcelio@mail.utexas.edu Office (NST 2.110): (512) 232-7002 Kratos XPS lab (NST 2.108): (512) 475-9546 SEM lab (NST 2.106): (512) 232-7169 Cell phone (512) 705-2379

Facility location:  UT-Austin main campus, NST building (room 2.106)  

	Services	Training of new users in the operation of the instruments.  Consultation on applications. Specimen preparation facility: Ag, Cu, Al, Pd, Ta, B, Ti and Si coater Fee schedule:  $40.00 per hr. for UT-Austin users