Equipment by Research Use: Crystallinity / Texture

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Name Category Contact
Rigaku MiniFlex 600 II Swinnea, Steve
Wyko NT 9100 Optical Profilometer Piner, Richard
Rigaku Ultima IV Swinnea, Steve
Rigaku MiniFlex 600 I Swinnea, Steve
Philips XPERT Theta-Theta Diffractometer Swinnea, Steve
Small Angle X-Ray Scattering (SAXS) Swinnea, Steve
FEI Quanta 650 ESEM Zhang, Shouliang Jarvis, K.
Philips Vertical Scanning Diffractometer Swinnea, Steve
Hitachi S5500 SEM/STEM Zhang, Shouliang Jarvis, K.
Scintag X1 Theta-Theta Diffractometer Swinnea, Steve
JEOL 2010F Transmission Electron Microscope (TEM) Jarvis, K. Zhang, Shouliang
Name Category Contact