FEI Strata DB235 SEM/FIB with Zyvex S100

Reserve Equipment

Information the equipment can provide

The FEI Strata™ DB235 is a dual beam SEM/FIB system combing a scanning electron microscope (SEM) with thermal emission tip for high resolution imaging and a focused ion beam (FIB) with gallium metal ion beam source for nanoscale cutting. The system is capable of:

  • High Resolution SEM image with resolution ~3 nm
  • Nanoscale cutting of structures using focused ion beam while simultaneously monitoring the progress using SEM.
  • Gas injection system for metal deposition (electron or ion beam induced deposition)
  • TEM sample preparation

The Zyvex S100 is a manipulation and testing tool used with a focused ion beam (FIB) system for micro- and nanoscale research and development applications.

Fees & Policies
  • Trained On-Campus UT Users: $66/h
  • Higher Ed/State Agencies: $137/h
  • Corporate Users: $380/h

Facility User Education

To become a user of this instrument please sign up for the next available NT203 facility user education class.  External/Corporate users must contact CNM to setup an account before attending facility user education classes.

Fee: $133.00


FNT 3.110


Raluca Gearba