Atomic Force Microscopy

The atomic force microscope (AFM) is one kind of scanning probe microscopes (SPM).  SPMs are designed to measure local properties, such as height, friction, magnetism, with a probe. To acquire an image, the SPM raster-scans the probe over a small area of the sample, measuring the local property simultaneously.  AFMs operate by measuring force between a probe and the sample.

TMI offers four instruments in EER 6.626

 

Park Systems
Autoprobe CP-R

Park Systems
XE-100

Park systems
NX10

Asylum
MFP-3D